Sifting data in the real world
- 1 January 2006
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 556 (1) , 308-324
- https://doi.org/10.1016/j.nima.2005.10.019
Abstract
No abstract availableKeywords
All Related Versions
This publication has 2 references indexed in Scilit:
- Review of Particle PropertiesPhysical Review D, 2002
- Robust Regression and Outlier DetectionPublished by Wiley ,1987