New compact model for induced gate current noise [MOSFET]

Publisher Website

22 March 2004

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iedm.2003.1269416

Abstract

No abstract available

This publication has 3 references indexed in Scilit:

Noise modeling for RF CMOS circuit simulation
IEEE Transactions on Electron Devices, 2003
High frequency noise of MOSFETs I Modeling
Solid-State Electronics, 1998
On the influence of hot carrier effects on the thermal noise of field-effect transistors
IEEE Transactions on Electron Devices, 1970