Superconducting thin films based on La2−xSrxCuO4
- 3 August 1987
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 51 (5) , 369-370
- https://doi.org/10.1063/1.98444
Abstract
Superconducting films (300–400 nm thick) of La2−xSrxCuO4 have been prepared by a combined evaporation‐reaction method. Amorphous films of the oxide are formed initially on sapphire substrates at deposition temperatures of 25–400 °C. Crystallized films can then be obtained with the desired tetragonal structure and show superconducting resistive transitions, with onsets between 23–28 K and zero resistivities near 4.2 K. A diamagnetic transition consistent with the onset‐resistive transition is seen for different samples and a critical current density of 0.4 A/cm2 is obtained.Keywords
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