Absolute Yields of X-Ray Induced Photoemission from Metals
- 1 January 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 19 (6) , 167-171
- https://doi.org/10.1109/tns.1972.4326827
Abstract
Absolute electron yields from tantalum, molybdenum, copper and aluminum have been measured for several x-ray bombarding geometries. The photon spectra used were derived from filtered bremsstrahlung generated in a tungsten anode at 50 KV, constant potential. The electron spectra were measured by a cylindrical electrostatic analyzer with a secondary emission detector. The spectra exhibit both Auger and scattered photoelectrons.Keywords
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