Metal-Backed Fluorescent Screen for High Temperature RHEED Observation
- 1 May 1980
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 19 (5)
- https://doi.org/10.1143/jjap.19.993
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Double diffraction spots in RHEED patterns from clean Ge(111) and Si(001) surfacesSurface Science, 1979
- Isothermal desorption of indium from √31−In and √3−In on silicon (111) surfacesSurface Science, 1979
- Surface Structures of Ag on Si (111) Surface Investigated by RHEEDJapanese Journal of Applied Physics, 1978
- Some New Techniques in Reflection High Energy Electron Diffraction (RHEED) Application to Surface Structure StudiesJapanese Journal of Applied Physics, 1977
- Si(111) surface structures by glancing-incidence high-energy electron diffractionActa Crystallographica Section A, 1972