Thermally accelerated degradation of 1.3 μm BH lasers
- 21 July 1983
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 19 (15) , 567-568
- https://doi.org/10.1049/el:19830386
Abstract
An investigation has been made into the thermally accelerated degradation in ACC lifetests for 1.3 μm BH lasers. The CW threshold current under high-stress aging has been evaluated at various temperatures. An increase in the CW threshold current was observed which could be represented as a combination of two linear variations. It was found that the rapid increase of the CW threshold current was dependent on the evaluation temperature, which could be an important parameter in assessing the degradation of InGaAsP lasers.Keywords
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