Influence of Laser Fluence on Structural and Ferroelectric Properties of Lead-Zirconate-Titanate Thin Films Prepared by Laser Ablation
- 1 September 1991
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 30 (9S) , 2167
- https://doi.org/10.1143/jjap.30.2167
Abstract
Ferroelectric lead-zirconate-titanate (PZT) thin films were deposited by excimer laser ablation on (100) MgO substrates with and without an electrode. The film composition was approximately the same as that of the target over a laser fluence range of 2.6 and 10 J/cm2·shot. Increase in the laser fluence enhances the film deposition rate and the crystallite size. In representative experiments, the remanent polarization and coercive field of the film prepared at a laser fluence of 9.2 J/cm2·shot were 28 µC/cm2 and 72 kV/cm, respectively.Keywords
This publication has 6 references indexed in Scilit:
- Ferroelectric properties of lead-zirconate-titanate films prepared by laser ablationApplied Physics Letters, 1991
- Pulsed laser deposition and ferroelectric characterization of bismuth titanate filmsApplied Physics Letters, 1991
- Preparation of Pb(Zn0.52Ti0.48)O3 Films by Laser AblationJapanese Journal of Applied Physics, 1990
- Crystallization Induced by Laser Irradiation in Ba-Y-Cu-O Superconducting Films Prepared by Laser AblationJapanese Journal of Applied Physics, 1989
- Epitaxial growth of thin films of BaTiO3 using excimer laser ablationApplied Physics Letters, 1989
- a-Si1-xOx:H Films Prepared by Direct Photo-CVD Using CO2 GasJapanese Journal of Applied Physics, 1988