Simultaneous measurement of spectral distribution and shape
- 11 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 3, 803-806
- https://doi.org/10.1109/icpr.2000.903666
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Multichannel vision system for estimating surface and illumination functionsJournal of the Optical Society of America A, 1996
- NEAR-SENSOR REAL TIME SPECTRAL CLASSIFICATION FOR INDUSTRIAL APPLICATIONSPublished by World Scientific Pub Co Pte Ltd ,1995