Accurate electron probe determination of aluminum composition in (Al, Ga)As and correlation with the photoluminescence peak
- 15 January 1985
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 57 (2) , 512-515
- https://doi.org/10.1063/1.334784
Abstract
The composition of Alx Ga1−xAs has been measured with improved accuracy by electron probe microanalysis using an aluminum-copper alloy standard rather than an elemental aluminum standard. Details of the experimental procedure are given. A calibration curve, relating the photoluminescence peak energy (Ep) to aluminum concentration (x), has been obtained. A least-squares fit to the data gives Ep(eV)=1.42+1.45x−0.25x2 for 0<x≤0.45.This publication has 3 references indexed in Scilit:
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- Quantitative Electron Microprobe Analysis of Thin Films on SubstratesIBM Journal of Research and Development, 1974
- Phase equilibria in the GaAs and the GaP systemsJournal of Physics and Chemistry of Solids, 1965