THE SCANNING ION MICROPROBE: AN ALTERNATIVE TO THE SCANNING ELECTRON MICROSCOPE
- 1 March 1978
- journal article
- Published by Wiley in Annals of the New York Academy of Sciences
- Vol. 306 (1) , 223-261
- https://doi.org/10.1111/j.1749-6632.1978.tb25651.x
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Quantum Efficiency Measurements of Windowless Electron Multipliers to Heavy High Energy ParticlesIEEE Transactions on Nuclear Science, 1975
- General views on 3-D image reconstruction and computerized transverse axial tomographyIEEE Transactions on Nuclear Science, 1974
- Biomedical Applications and Instrumental Implications of Ion MicroprobeIEEE Transactions on Nuclear Science, 1974
- -Shell Ionization of and C by 50- to 600-keV , , , and ImpactPhysical Review A, 1973
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973
- Oxide-thickness determination by proton-induced x-ray fluorescenceJournal of Applied Physics, 1972
- New Ceramic Electron MultiplierIEEE Transactions on Nuclear Science, 1972
- Interaction of 25 keV Electrons with the Nucleic Acid Bases, Adenine, Thymine, and Uracil. II. Inner Shell Excitation and Inelastic Scattering Cross SectionsThe Journal of Chemical Physics, 1972
- Determination of Trace Elements in Samples by Nuclear Scattering and Reaction TechniquesIEEE Transactions on Nuclear Science, 1971
- FIELD ION MICROSCOPYPublished by Defense Technical Information Center (DTIC) ,1969