Single-Electron Pump Based on Charging Effects

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Abstract
We have designed and operated a device consisting of three nanoscale tunnel junctions biased below the Coulomb gap. Phase shifted r.f. voltages of frequency f applied to two gates "pump" one electron per cycle through the device. This is shown experimentally by plateaus in the current-voltage characteristic at I = ± ef, the sign of the current depending on the relative phase of the r.f. voltages and not on the sign of the bias voltage.