High-resolution electron microscope study of lamellar boundaries in Ti-rich TiAl polysynthetically twinned crystals
- 1 November 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 39 (1-4) , 268-278
- https://doi.org/10.1016/0304-3991(91)90206-l
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Anomalous temperature dependence of the yield stress of Ti3Al by {1121} 〈1126〉 slipPhilosophical Magazine Letters, 1990
- Deformation of polysynthetically twinned crystals of TiAl with a nearly stoichiometric compositionPhilosophical Magazine A, 1990
- Twin and fault structures in titanium aluminidesScripta Metallurgica, 1989
- Twinning in TiAlScripta Metallurgica, 1989
- Stoichiometry effects: on the deformation of binary TiAl alloysJournal of Materials Research, 1989
- The influence of second phase Ti3Al on the deformation mechanisms in TiAlPhilosophical Magazine Letters, 1989
- Effect of purity and second phase on ductility of TiAlScripta Metallurgica, 1988
- Twin relationships in TiAlScripta Metallurgica, 1988
- Plastic deformation of the intermetallic compound Al3TiPhilosophical Magazine A, 1987
- The plastic deformation of TiAlMetallurgical Transactions, 1974