Noise power fluctuations and the masking of sine signals

Publisher Website
Google Scholar
Abstract
This article is concerned with fluctuations in noise power and with the role that such fluctuations play in the masking of sine signals by noise. Several measures of noise fluctuations are discussed: the fourth moment of the waveform, the fourth moment of the envelope, and the crest factor. Relationships among these quantities are found for cases of equal-amplitude random-phase noise and Rayleigh-distributed-amplitude noise. Of particular interest is a special non-Gaussian noise called low-noise noise in which the fluctuations are small by any of our measures. The results of frozen-noise masking experiments are reported, where the noise waveform was fixed for all stimulus presentations. In separate experiments, equal-amplitude random-phase Gaussian noise, with typical fluctuations, and low-noise noise, with almost no fluctuations were used. The data show that for a noise bandwidth less than the critical bandwidth, the masked threshold is about 5 dB lower for low-noise noise than for Gaussian noise. When the noise bandwidth is larger than the critical bandwidth, the masked threshold is the same for both kinds of noise. It is concluded that noise power fluctuations increase masked threshold by about 5 dB and that filtering by the auditory system reintroduces fluctuations into broadband low-noise noise.

This publication has 8 references indexed in Scilit: