Determination of thickness and roughness of thin copper films by X-Ray diffraction measurements
- 1 January 1983
- journal article
- research article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 314 (3) , 337-339
- https://doi.org/10.1007/bf00516835
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Determination of surface roughness from X-ray diffraction measurements on thin filmsApplications of Surface Science, 1982
- Structure investigations on single-crystal gold filmsApplied Physics A, 1977
- Etudes de la structure de raies de diffraction des rayons X par des couches minces d'orActa Crystallographica, 1962