Evidence of Adsorbed Atom Pairing during Homoepitaxial Growth of Silicon
- 29 May 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 74 (22) , 4448-4451
- https://doi.org/10.1103/physrevlett.74.4448
Abstract
The early stages of silicon homoepitaxy on Si(100) are studied with low temperature scanning tunneling microscopy. Adsorbed atoms and epitaxial dimers are observed. Adsorbed atoms form previously unobserved pairs which couple via a substrate mediated interaction. Transient nonthermal atomic motion leads to the formation of atom pairs and epitaxial dimers. A paired atom acts as if constrained by a potential trough and exhibits a lower barrier to motion than an unpaired atom. Paired atoms are observed to coalesce into a normal, epitaxially oriented silicon dimer.Keywords
This publication has 12 references indexed in Scilit:
- Simulations of crystal growth: Effects of atomic beam energyApplied Physics Letters, 1994
- Large-scaleab initiostudy of the binding and diffusion of a Ge adatom on the Si(100) surfacePhysical Review B, 1994
- Low-temperature, flux-independent epitaxy in Ag/Si(111)Surface Science, 1994
- Atom condensation at lattice steps and clustersPhysical Review Letters, 1993
- A variable temperature scanning tunneling microscope for use in ultrahigh vacuumReview of Scientific Instruments, 1992
- Direct observation of an increase in buckled dimers on Si(001) at low temperaturePhysical Review Letters, 1992
- Activation energy for surface diffusion of Si on Si(001): A scanning-tunneling-microscopy studyPhysical Review Letters, 1991
- Atom condensation on an atomically smooth surface: Ir, Re, W, and Pd on Ir(111)The Journal of Chemical Physics, 1991
- Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 KPhysical Review Letters, 1989
- Determination of Adsorption Energy Heterogeneity of Solid SurfacesThe Journal of Chemical Physics, 1954