The origin of double peak electric field distribution in heavily irradiated silicon detectors
- 1 January 2002
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 476 (3) , 556-564
- https://doi.org/10.1016/s0168-9002(01)01642-4
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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