Trace Lead Analysis Employing a Dual-Channel Single-Crystal X-Ray Spectrometer
- 1 January 1970
- journal article
- research article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 24 (1) , 100-103
- https://doi.org/10.1366/000370270774372056
Abstract
A single-channel x-ray spectrometer has been converted to a two-channel instrument. Two separate planes in a single lithium fluoride crystal are employed to reflect, simultaneously, two portions of the x-ray spectrum. The instrument has been used to measure trace quantities of lead in the form of particulate matter as an air pollutant. One crystal plane was used to reflect the lead Lα emission line while the second plane reflected background radiation near that line.Keywords
This publication has 4 references indexed in Scilit:
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- Scanning Single-Crystal Multichannel X-Ray SpectrometerReview of Scientific Instruments, 1963
- Crystallographic Aspects of Extra Reflections in X-Ray Spectrochemical AnalysisJournal of Applied Physics, 1960
- Laue Spectrometer for Multichannel X-Ray Spectrochemical AnalysisReview of Scientific Instruments, 1960