A VLSI communication processor designed for testability

Publisher Website

1 January 1984

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 172-173
https://doi.org/10.1109/isscc.1984.1156646

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Model for Transient and Permanent Error-Detection and Fault-Isolation Coverage
IBM Journal of Research and Development, 1982