Study of Electron Irradiation-Induced Defects in N-Type Active Layer of GaAs Mesfet
- 1 January 1986
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 10-12, 1039-1044
- https://doi.org/10.4028/www.scientific.net/msf.10-12.1039
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: