Mesure de l'electroreflectance des metaux au moyen de structures metal-isolant-metal (Ag-Al2O3-Au)
- 31 January 1980
- journal article
- Published by Elsevier in Optics Communications
- Vol. 32 (1) , 105-108
- https://doi.org/10.1016/0030-4018(80)90324-7
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Surface Phenomena in the Polarization-Dependent Electroreflectance Spectra of SiPhysica Status Solidi (b), 1978
- Electroreflectance spectra of Ag(111) electrodesSurface Science, 1977
- Schottky-barrier electroreflectance of Ge: Nondegenerate and orbitally degenerate critical pointsPhysical Review B, 1975
- Étude expérimentale et théorique de l'électroréflexion de l'or en incidence obliqueSurface Science, 1974
- Electroreflectance: A Status ReportPhysica Status Solidi (b), 1973
- Energetic electronic processes and negative resistance in amorphous TaTa2O5Au and AlAl2O3Au diodesThin Solid Films, 1972
- Électroréflexion : mesures et systèmes d'asservissementRevue de Physique Appliquée, 1972
- Differential reflection spectroscopy of very thin surface filmsSurface Science, 1971
- Electrical phenomena in amorphous oxide filmsReports on Progress in Physics, 1970
- Electroreflectance in MetalsPhysical Review Letters, 1966