A unified built-in-test scheme: UBIST

• 6 January 2003
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• https://doi.org/10.1109/ftcs.1988.5314

Abstract

Keywords

• INTEGRATED CIRCUIT TESTING
• INTEGRATED LOGIC CIRCUITS
• LOGIC TESTING
• UBIST
• INTEGRATED CIRCUITS
• SELF-CHECKING CIRCUITS
• UNIFIED BUILT-IN-TEST SCHEME