Non-Oxygen Negative Primary Ion Beams for Oxygen Isotopic Analysis in Insulators
- 1 January 1986
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- CF 3 + : An Alternative Primary Beam Source for the Sensitive Detection of Electropositive Elements in SIMSPublished by Springer Nature ,1984
- Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurementsJournal of Applied Physics, 1976