A new ultra-high vacuum scanning tunneling microscope design for surface science studies

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Abstract
We have constructed a new scanning tunneling microscope (STM) designed especially for surface science studies. The novel feature of this design is a sample holder that can be backed away from the STM and then rotated about the central axis of a typically configured UHV chamber. This integrated sample holder design allows simple, rapid sample transit between scanning tunneling microscopy and a number of other surface analytical techniques. All sample motion is accomplished with a single UHV motion feedthrough. Atomic resolution images of highly oriented pyrolytic graphite and current voltage curves obtained with the STM are shown.