Identification of chemical components in XPS spectra and images using multivariate statistical analysis methods
- 31 December 2001
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 121 (1-3) , 33-55
- https://doi.org/10.1016/s0368-2048(01)00325-5
Abstract
No abstract availableKeywords
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