On the Calculation of Thin Film Refractive Index and Thickness by Ellipsometry
- 1 January 1967
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 6 (1) , 168-169
- https://doi.org/10.1364/ao.6.000168
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963