Nondestructive measurement of solar cell sheet resistance using a laser scanner
- 1 May 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 31 (5) , 566-570
- https://doi.org/10.1109/t-ed.1984.21570
Abstract
Experimental data have shown that a laser scanner can be used as a probe to make nondestructive measurements of solar cell sheet resistance width an accuracy of several percent. The photovoltaic response from cells with controlled sheet resistance was measured using the scanner and compared with the theoretical predictions made by other workers. Several limitations in this technique are identified and a measurement methodology is suggested.Keywords
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