Secondary-ion emission from phenylalanine induced by atomic and molecular MeV ion beams
- 1 June 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 45 (21) , 12218-12221
- https://doi.org/10.1103/physrevb.45.12218
Abstract
Relative yields of positive and negative secondary ions are measured for atomic and molecular MeV ion beam impinging on a phenylalanine target. The secondary ions were identified by a time-of-flight mass spectrometer. , , , and were the beams used. The yields obtained for [M-H, [M+H, and [M-COOH secondary ions show that they are roughly proportional to the third power of the beam stopping power. Other experimental results and predictions of the molecular-expansion model for neutral ejected species are included in the discussion.
Keywords
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