X-ray photoelectron spectroscopy measurement of valence-band offsets for Mg-based semiconductor compounds
- 20 June 1994
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 64 (25) , 3455-3457
- https://doi.org/10.1063/1.111239
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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