Tolerance Assignment for IC Selection Tests
- 1 April 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 4 (2) , 156-162
- https://doi.org/10.1109/tcad.1985.1270109
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Statistical Simulation of the IC Manufacturing ProcessIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1982
- Optimum Designs in Regression ProblemsThe Annals of Mathematical Statistics, 1959