On The Design of New Integrated Microprobes (NIMPs) for Non-Linear On-Wafer Device Characterization
- 1 June 1993
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 23, 57-78
- https://doi.org/10.1109/arftg.1993.327020
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- A New Load-Pull Characterization Method for Microwave Power TransistorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- A high power on-wafer pulsed active load pull systemPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A new multiharmonic loading method for large-signal microwave and millimeter-wave transistor characterizationIEEE Transactions on Microwave Theory and Techniques, 1991
- A wideband millimeter wave six-port reflectometer using four diode detectors calibrated without a power ratio standardIEEE Transactions on Instrumentation and Measurement, 1991
- A six-port network analyzer load-pull system for active load tuningIEEE Transactions on Instrumentation and Measurement, 1990
- Repetitive and single shot pulse microwave six-port reflectometerIEEE Transactions on Instrumentation and Measurement, 1990
- A Novel Whiskerless Schottky Diode for Millimeter and Submillimeter Wave ApplicationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1987
- Automatic analysis of two-port active microwave networkElectronics Letters, 1982
- The automatic measurement of TV-port microwave junctions by means of the six-port techniqueIEEE Transactions on Instrumentation and Measurement, 1982
- A Network Analyzer Incorporating Two Six-Port ReflectometersIEEE Transactions on Microwave Theory and Techniques, 1977