Saturation of Fe2+ ion concentration in single-crystal YIG(Si)
- 1 March 1977
- journal article
- letter
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 48 (3) , 1364-1365
- https://doi.org/10.1063/1.323733
Abstract
The relative Fe2+ ion concentrations in three flux‐grown crystals of YIG(Si), containing up to 0.3 Si4+ ion per formula unit, have been determined by optical techniques. The Fe2+ ion concentration appears to reach a maximum or saturation value at Si4+ ion content of 0.1 per formula unit. The Si4+ ions not compensated by Fe2+ or Pb2+ ions, the sum of which is less than the Si4+ ion content, must be compensated by cation vacancies.This publication has 6 references indexed in Scilit:
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