Effect of Stress on field Confinement in Channel Waveguides formed by Defining Si3N4 Ridges on GaALAS Multilayer Structures
- 1 January 1989
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Raman Spectroscopy Applied To The Characterization Of Semiconductors And Semiconductor MicrostructuresPublished by SPIE-Intl Soc Optical Eng ,1988
- Photoelastic waveguides and their effect on stripe-geometry GaAs/Ga1−xAlxAs lasersJournal of Applied Physics, 1979