AESOP: a simulation-based knowledge system for CMOS process diagnosis
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Semiconductor Manufacturing
- Vol. 2 (3) , 94-103
- https://doi.org/10.1109/66.29675
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A developmental expert system for test structure ata evaluationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Expert System For Test Structure Data InterpretationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- A framework for knowledge-based computer-integrated manufacturingIEEE Transactions on Semiconductor Manufacturing, 1989
- Impulse-86: a substrate for object-oriented interface designPublished by Association for Computing Machinery (ACM) ,1986