Infra-red radiometry of semiconductor devices

• 1 November 1967
• journal article
• Published by Elsevier in Microelectronics Reliability
• Vol. 6  (4) , 307-315
• https://doi.org/10.1016/0026-2714(67)90085-6

Abstract

Keywords

• SEMICONDUCTOR DEVICES
• INFRA RED RADIOMETRY
• RADIOMETRY OF SEMICONDUCTOR