Spherical crystal imaging spectrometer (SCIS) for cosmic x-ray spectroscopy
- 1 October 1980
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 19 (19) , 3306-3312
- https://doi.org/10.1364/ao.19.003306
Abstract
The application of a spherically bent crystal x-ray spectrometer to cosmic x-ray problems is discussed. This is the only geometry whose diffraction properties are preserved under all rotations of the spacecraft. The combination of Bragg reflection and spherical aberration provides for stigmatic imaging of extended sources and minimum spatial and/or spectral resolution loss arising from source extent and spacecraft pointing errors. The sensitivity of the instrument is discussed in the context of a Spacelab mission.Keywords
This publication has 8 references indexed in Scilit:
- X-ray spectrum of Cassiopeia A measured with the Einstein SSSThe Astrophysical Journal, 1979
- The Einstein /HEAO 2/ X-ray ObservatoryThe Astrophysical Journal, 1979
- The Comptonization of iron X-ray features in compact X-ray sourcesThe Astrophysical Journal, 1978
- Bent crystal spectrometer for solar x-ray spectroscopyReview of Scientific Instruments, 1977
- The Leicester X-ray Crystal Spectrometer on Ariel V and some Early Results on CAS A, Tycho and SCO X-1Monthly Notices of the Royal Astronomical Society, 1976
- Conical Focusing Crystal Spectrometers for Cosmic X-Ray AstronomyApplied Optics, 1973
- Polarimeter for Celestial X RaysThe Astronomical Journal, 1969
- Conical Two-Crystal Monochromator for Scattering, Diffraction, and Absorption Cross Section Work with Slow NeutronsReview of Scientific Instruments, 1961