Study of nonlinear optical effects in GaN:Mg epitaxial film

Abstract
The second‐order nonlinear optical coefficients d 33, d 31, and d 15 of GaN:Mgepitaxialfilm were studied by the standard Maker fringe of an anisotropic medium. The measured d 33=−(16.5±1.3) pm/V which is 55 times of the d 11 of quartz. The measured ratios of d 33/d 31 and d 31/d 15 showed that the crystalline film is close to an ideal wurzite structure. The refractive indices and the dispersive curves of n e , n 0 were also determined by TM and TE waveguide mode measurements.

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