Detection of high mass cluster ions sputtered from Bi surfaces
- 1 December 1976
- journal article
- Published by Elsevier in Chemical Physics Letters
- Vol. 44 (2) , 371-373
- https://doi.org/10.1016/0009-2614(76)80533-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Adsorption and surface reactivity of metals by secondary ion mass spectrometry. Part 1.—Adsorption of carbon monoxide on nickel and copperJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1976
- Developments in secondary ion mass spectroscopy and applications to surface studiesSurface Science, 1975
- Clusters sputtered from tungstenRadiation Effects, 1972
- Distributions énergétique et angulaire de l'émission ionique secondaire. III. Distribution angulaire et rendements ioniquesJournal de Physique, 1968