Interferometric Measurement of Resonance Transition Wavelengths in C [CSC]iv[/CSC], S[CLC]i[/CLC] [CSC]iv[/CSC], A[CLC]l[/CLC] [CSC]iii[/CSC], A[CLC]l[/CLC] [CSC]ii[/CSC], and S[CLC]i[/CLC] [CSC]ii[/CSC]

Open Access
Publisher Website
Google Scholar
Abstract
We have made the first interferomeric measurements of the wavelengths of the important ultraviolet diagnostic lines in the spectra C IV near 155 nm and Si IV near 139 nm with a vacuum ultraviolet Fourier transform spectrometer and high-current discharge sources. The wavelength uncertainties were reduced by 1 order of magnitude for the C IV lines and by 2 orders of magnitude for the Si IV lines. Our measurements also provide accurate wavelengths for resonance transitions in Al III, Al II, and Si II.
All Related Versions