Determination of field ion tip shapes

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Abstract
An empirical method has been developed for determining the tip shapes from field ion micrographs utilizing digitization and computer graphics techniques. Application of this method to tungsten and iridium specimens indicates that the tip profiles deviate significantly from a hemisphere, and on a fine scale the shape varies from region to region over the specimen surface. However, for practical purposes the entire end form can be represented by a polynomial of degree 4 or 5.

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