Electron Energy Loss Microspectroscopy: Small Particles in Silicon
- 1 January 1985
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- SiL core edge fine structure in an oxidation series of silicon compounds: A comparison of microelectron energy loss spectra with theoryJournal of Applied Physics, 1985
- Time-Resolved Electron Energy Loss Spectroscopy on Copper OxidesProceedings, annual meeting, Electron Microscopy Society of America, 1985
- SIGMAL: A Program for Calculating L-Shell lonization Cross-SectionsProceedings, annual meeting, Electron Microscopy Society of America, 1981
- Extended Core Edge Fine Structure in Electron Energy Loss SpectraPublished by Springer Nature ,1981
- K-shell ionization cross-sections for use in microanalysisUltramicroscopy, 1979
- The Basic Principles of Electron Energy Loss SpectroscopyPublished by Springer Nature ,1979