Kr3d52:3d32branching ratio from 97 to 200 eV

Abstract
The Kr 3d52:3d32 branching ratio has been measured between 97 and 200 eV photon energies using monochromatized synchrotron radiation from the Tantalus storage ring. The branching ratios have been obtained both from the Kr 3d52,32 photolines, and from the Kr M4,5N1N2,3 (P11) Auger lines in the low- and high-photon-energy ranges where the direct photoelectron measurements are very difficult. The agreement between results for the two methods is very good. In contrast with the Xe 4d52:4d32 branching ratio, the Kr 3d52:3d32 ratio is almost a constant and very close to the statistical value of 1.5 throughout the energy range studied. Our results are not in good agreement with the theoretical relativistic random-phase approximation results which predict a variation of the 3d52:3d32 ratio of 1.4-1.7 between 100 and 120 eV, due to an initial decrease in 3d cross sections to 105 eV followed by a slow increase. Our results show that the 3d cross sections increase immediately above threshold.