Apparent barrier height in scanning tunneling microscopy
- 15 June 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 37 (17) , 10395-10398
- https://doi.org/10.1103/physrevb.37.10395
Abstract
The apparent barrier height in the scanning tunneling microscope, defined in terms of the rate of change (at constant bias) of the logarithm of current with tip-sample separation, is calculated as a function of separation. It is found to be substantially lower than the sample work function in the range of tip-sample separations commonly used experimentally, and becomes very small in the region just before contact between tip and sample.Keywords
This publication has 13 references indexed in Scilit:
- Atomic arrangement of sulfur adatoms on Mo(001) at atmospheric pressure: A scanning tunneling microscopy studyPhysical Review Letters, 1988
- Resistance of a one-atom contact in the scanning tunneling microscopePhysical Review B, 1987
- Local tunneling barrier height images obtained with the scanning tunneling microscopeSurface Science, 1987
- Measurement of workfunctions by tunnelling and the effect of the image potentialSurface Science, 1985
- Theory of the bimetallic interfacePhysical Review B, 1985
- Electron-metal-surface interaction potential with vacuum tunneling: Observation of the image forcePhysical Review B, 1984
- Scanning tunneling microscopySurface Science, 1983
- Interaction between Closed-Shell Systems and Metal SurfacesPhysical Review Letters, 1981
- Self-Consistent Equations Including Exchange and Correlation EffectsPhysical Review B, 1965
- Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963