The syncang method for simultaneous measurement of film refractive index and thickness
- 1 September 1974
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 23 (2) , 153-160
- https://doi.org/10.1016/0040-6090(74)90236-3
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Barium Silicate Films for Integrated Optical CircuitsApplied Optics, 1973
- Theory of the Prism–Film Coupler by Plane-Wave AnalysisJournal of the Optical Society of America, 1970
- Theory of Prism–Film Coupler and Thin-Film Light GuidesJournal of the Optical Society of America, 1970
- Sputtered Glass Waveguide for Integrated Optical CircuitsBell System Technical Journal, 1969
- MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMSApplied Physics Letters, 1969