Defect and structure analysis of n+-, p+- and p-type porous silicon by the electron paramagnetic resonance technique

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31 December 1993

journal article
Published by Elsevier in Journal of Luminescence

Vol. 57 (1-6) , 301-313
https://doi.org/10.1016/0022-2313(93)90148-g

Abstract

No abstract available

Keywords

This publication has 28 references indexed in Scilit:

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