Dynamic Fault Imaging of VLSI Random Logic Devices

• 1 April 1984
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• No. 07350791,p. 281-283
• https://doi.org/10.1109/irps.1984.362061

Abstract

Keywords

• VERY LARGE SCALE INTEGRATION
• LOGIC DEVICES
• MICROPROCESSORS
• BONDING
• TESTING