Concept of an imaging XPS system
- 1 January 1988
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 11 (1-2) , 69-79
- https://doi.org/10.1002/sia.740110109
Abstract
No abstract availableKeywords
This publication has 25 references indexed in Scilit:
- Recent developments in spatially resolved ESCASurface and Interface Analysis, 1987
- Scanning ion microscopy: Elemental maps at high lateral resolutionApplied Surface Science, 1986
- Four classes of selected area XPS (SAXPS): an examination of methodology and comparison with other techniquesSpectrochimica Acta Part B: Atomic Spectroscopy, 1985
- The Development of Single and Multilayered Wolter X-ray MicroscopesPublished by SPIE-Intl Soc Optical Eng ,1985
- Soft x-ray microscopesReview of Scientific Instruments, 1985
- Grazing Incidence Optics for X-Ray MicroscopyPublished by Springer Nature ,1984
- A high resolution multipurpose ESCA instrument with X-ray monochromatorNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Scanning auger electron microscopy with high spatial or high energy resolutionVacuum, 1982
- Energy analysers for charged particle beamsJournal of Physics E: Scientific Instruments, 1973
- A high resolution ESCA instrument with X-ray monochromator for gases and solidsJournal of Electron Spectroscopy and Related Phenomena, 1973