Cell structure properties during in situ creep experiments in the H.V.E.M.
- 1 January 1978
- journal article
- Published by Cambridge University Press (CUP) in Proceedings, annual meeting, Electron Microscopy Society of America
- Vol. 36 (1) , 574-575
- https://doi.org/10.1017/s0424820100110015
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Sur le fluage par déviationRevue de Physique Appliquée, 1977
- Sub-grain boundary migration in aluminiumPhilosophical Magazine, 1972