Status and problems of semiconductor detectors
- 1 May 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 196 (1) , 107-116
- https://doi.org/10.1016/0029-554x(82)90624-3
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Transmission electron microscopy and Rutherford backscattering studies of different damage structures in P+ implanted SiJournal of Applied Physics, 1980
- Protective Surface Coatings on Semiconductor Nuclear Radiation DetectorsIEEE Transactions on Nuclear Science, 1980
- Cadmium telluride and mercuric iodide gamma radiation detectorsNuclear Instruments and Methods, 1979
- Development of the semiconductor radiation detectorNuclear Instruments and Methods, 1979
- ISEE-C HKH High Energy Cosmic RaysIEEE Transactions on Geoscience Electronics, 1978
- Semiconductor Detectors - An IntroductionIEEE Transactions on Nuclear Science, 1978
- Passivation Coatings on Silicon DevicesJournal of the Electrochemical Society, 1975
- Gamma Ray Efficiency Comparisons for Si(Li), Ge, CdTe and HgI2 DetectorsIEEE Transactions on Nuclear Science, 1973
- High Purity Germanium for Detector FabricationIEEE Transactions on Nuclear Science, 1971
- Study of Surface Effects in Thick Lithium Drifted Silicon Radiation DetectorsIEEE Transactions on Nuclear Science, 1964