Characterization of Y-Ba-Cu-O Thin Films on Metallic Substrates Using Co-Evaporation Technique
- 1 August 1991
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 30 (8A) , L1363
- https://doi.org/10.1143/jjap.30.l1363
Abstract
A tape wire having the structure of YBCO/YSZ/Hastelloy, of which a YBCO layer was fabricated by a co-evaporation technique, was prepared. The critical current density J c of 2.3×104 A/cm2 at 77 K and 0 T was obtained by using an rf coil and a dc bias at substrate heater during the YBCO layer growth, which enabled denser surface morphology in the YBCO layer. It was considered that the surface smoothness of a YSZ buffer layer had a large influence on the degree of c-axis orientation of the YBCO layer from the view of microstructural observation by transmission electron microscopy (TEM).Keywords
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