Circuit de coincidence dans le domaine de la nano-seconde a resolution variable et a transistors avalanche
- 30 November 1963
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 24, 229-240
- https://doi.org/10.1016/0029-554x(63)90313-6
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Avalanche Breakdown in SiliconPhysical Review B, 1954
- A Fast Coincidence-Anticoincidence AnalyzerReview of Scientific Instruments, 1953